IONTOF - TOF-SIMS time of flight secondary ion mass spectrometry - LEIS low energy ion scattering. Ion beam technology products for surface spectrometry, surface analysis, depth profiling, surface imaging, 3D analysis, retrospective analysis

IONTOF TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy iss. Company for products for surface analysis, surface spectrometry, surface imaging, depth profiling, retrospective analysis and 3D analysis

OVERVIEW

This domain iontof.com currently has a traffic classification of zero (the lower the more users). We have audited nineteen pages within the domain iontof.com and found fifty-seven websites referencing iontof.com. We have detected one contacts and directions for iontof.com to help you contact them. We have detected three mass media sites retained by this website. This domain iontof.com has been on the internet for one thousand two hundred and thirty-one weeks, nine days, twenty-six minutes, and thirty-six seconds.
Pages Analyzed
19
Links to this site
57
Contacts
1
Locations
1
Social Links
3
Online Since
Nov 2000

IONTOF.COM RANKINGS

This domain iontof.com has seen fluctuating levels of traffic for the duration of the year.
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IONTOF.COM HISTORY

This domain iontof.com was started on on November 23, 2000. This web site was last updated on the date of June 21, 2013. It will expire on the date of March 20, 2015. As of today, it is one thousand two hundred and thirty-one weeks, nine days, twenty-six minutes, and thirty-six seconds young.
REGISTERED
November
2000
UPDATED
June
2013
EXPIRED
March
2015

WEBSITE PERIOD

23
YEARS
7
MONTHS
9
DAYS

LINKS TO BUSINESS

European Conference on Applications of Surface and Interface Analysis ECASIA

Many thanks to the 430 participants. Save the date for the next edition in Dresden, Germany on 15-20 September 2019. European Conference on Applications of Surface and Interface Analysis. Is the major event in Europe in this field. Attracting an ever increasing international audience. ECASIA17 takes place in Montpellier, France, from 24 to 29 September.

Welcome - upmc

June 27th - 30th, 2011. 4 place Jussieu 75005 Paris, France.

La Trobe University, Melbourne Victoria Australia

Colleges, Schools and Departments. Need the flexibility to study anywhere, any time? La Trobe Online offers support and the chance to have study fit around your life, not the other way around. Arts, social sciences and communications. Study at one of our campuses.

Laboratorní a zkušební technika - Specion

Leica EM TICX3, unikátní systém iontové přípravy vzorků. Trojice iontových zdrojů zajišťuje velmi kvalitní výsledky iontového řezání i leštění. Koncept vyměnitelných stolků umožňuje přizpůsobení širokému spektru aplikací. Leica EM UC7, zaručená kvalita v ultramikrotomii. Leica Microsystems je tradičním výrobcem nejkvalitnějších ultramikrotomů na světě. Patentované technologie zaručují ty nejlepší výsledky při krájení.

Deutsch - Fraunhofer AWZ Soest

Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS. Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS. Temperaturstabile Leuchtstoffe für weiße LEDs. Um Weißlicht-LEDs weiter zu optimieren, ist die richtige Kombination von LED und Leuchtstoff entscheidend. Lumineszierende Gläser für weiße Leuchtdioden.

WHAT DOES IONTOF.COM LOOK LIKE?

Desktop Screenshot of iontof.com Mobile Screenshot of iontof.com Tablet Screenshot of iontof.com

CONTACTS

ION-TOF GmbH

Thomas Heller

Gievenbecker Weg 15

Muenster, NRW, 48149

DE

IONTOF.COM HOST

We observed that the main root page on iontof.com took seven hundred and fifty-six milliseconds to load. Our web crawlers detected a SSL certificate, so in conclusion our crawlers consider this site secure.
Load time
0.756 seconds
SSL
SECURE
Internet Address
134.119.33.166

NAME SERVERS

a.ns14.net
b.ns14.net
c.ns14.net
d.ns14.net

FAVORITE ICON

SERVER OPERATING SYSTEM

I observed that this domain is implementing the Apache/2.4.29 os.

TITLE

IONTOF - TOF-SIMS time of flight secondary ion mass spectrometry - LEIS low energy ion scattering. Ion beam technology products for surface spectrometry, surface analysis, depth profiling, surface imaging, 3D analysis, retrospective analysis

DESCRIPTION

IONTOF TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy iss. Company for products for surface analysis, surface spectrometry, surface imaging, depth profiling, retrospective analysis and 3D analysis

CONTENT

This domain iontof.com had the following in the web site, "Surface Analysis Meets Organic Mass Spectrometry." Our analyzers observed that the webpage stated " Quantitative Top Atomic Layer Characterisation." The Website also stated " High end Vacuum SPM Technology. Superior Performance for all SIMS Applications. SIMS 5 is the latest generation of high-end TOF-SIMS instruments developed over the last 25 years. Its design guarantees optimum performance in all fields of SIMS applications. Quantitative Top Atomic Layer Characterisation." The website's header had IONTOF as the most important keyword. It was followed by TOF-SIMS, LEIS, and company which isn't as highly ranked as IONTOF. The next words the site used was products. time of flight was also included but could not be understood by web crawlers.

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